Other articles related with "surface roughness":
47901 Tiancun Hu(胡天存), Shukai Zhu(朱淑凯), Yanan Zhao(赵亚楠), Xuan Sun(孙璇), Jing Yang(杨晶), Yun He(何鋆), Xinbo Wang(王新波), Chunjiang Bai(白春江), He Bai(白鹤), Huan Wei(魏焕), Meng Cao(曹猛), Zhongqiang Hu(胡忠强), Ming Liu(刘明), and Wanzhao Cui(崔万照)
  Effect of Cu doping on the secondary electron yield of carbon films on Ag-plated aluminum alloy
    Chin. Phys. B   2022 Vol.31 (4): 47901-047901 [Abstract] (400) [HTML 1 KB] [PDF 1050 KB] (216)
77402 Huan Ge(葛欢), Yi-Rong Jin(金贻荣), Xiao-Hui Song(宋小会)
  High quality NbTiN films fabrication and rapid thermal annealing investigation
    Chin. Phys. B   2019 Vol.28 (7): 77402-077402 [Abstract] (633) [HTML 1 KB] [PDF 1222 KB] (174)
16801 Gao-Feng Liang(梁高峰), Jiao Jiao(焦蛟), Xian-Gang Luo(罗先刚), Qing Zhao(赵青)
  Measurement and analysis of the surface roughness of Ag film used in plasmonic lithography
    Chin. Phys. B   2017 Vol.26 (1): 16801-016801 [Abstract] (610) [HTML 1 KB] [PDF 1145 KB] (531)
55202 Wang Huan (王欢), Cao Li-Hua (曹莉华), Zhao Zong-Qing (赵宗清), Yu Ming-Yang (郁明阳), Gu Yu-Qiu (谷渝秋), He Xian-Tu (贺贤土)
  Effect of inner-surface roughness of conical target on laser absorption and fast electron generation
    Chin. Phys. B   2014 Vol.23 (5): 55202-055202 [Abstract] (640) [HTML 1 KB] [PDF 340 KB] (436)
107104 Qin Jie-Yu (秦洁宇), Du Gang (杜刚), Liu Xiao-Yan (刘晓彦)
  The effects of strain and surface roughness scattering on the quasi-ballistic characteristics of a Ge nanowire p-channel field-effect transistor
    Chin. Phys. B   2013 Vol.22 (10): 107104-107104 [Abstract] (550) [HTML 1 KB] [PDF 345 KB] (585)
77305 Wang Jian-Xia (王建霞), Yang Shao-Yan (杨少延), Wang Jun (王俊), Liu Gui-Peng (刘贵鹏), Li Zhi-Wei (李志伟), Li Hui-Jie (李辉杰), Jin Dong-Dong (金东东), Liu Xiang-Lin (刘祥林), Zhu Qin-Sheng (朱勤生), Wang Zhan-Guo (王占国)
  Electron mobility limited by surface and interface roughness scatterings in AlxGa1-xN/GaN quantum wells
    Chin. Phys. B   2013 Vol.22 (7): 77305-077305 [Abstract] (747) [HTML 1 KB] [PDF 419 KB] (648)
117308 Wang Jun-Cheng (王骏成), Du Gang (杜刚), Wei Kang-Liang (魏康亮), Zhang Xing (张兴), Liu Xiao-Yan (刘晓彦 )
  Three-dimensional Monte Carlo simulation of bulk fin field effect transistor
    Chin. Phys. B   2012 Vol.21 (11): 117308-117308 [Abstract] (1036) [HTML 1 KB] [PDF 290 KB] (1184)
96801 Li Xin-Li(李新利), Chen Yong-Sheng(陈永生), Yang Shi-E(杨仕娥), Gu Jin-Hua(谷锦华), Lu Jing-Xiao(卢景霄), Gao Xiao-Yong(郜小勇), Li Rui(李瑞), Jiao Yue-Chao(焦岳超), Gao Hai-Bo(高海波), and Wang Guo(王果)
  Influence of Boron doping on microcrystalline silicon growth
    Chin. Phys. B   2011 Vol.20 (9): 96801-096801 [Abstract] (1291) [HTML 1 KB] [PDF 306 KB] (809)
40702 Li Yu-De(李玉德),Lin Xiao-Yan(林晓燕),Tan Zhi-Yuan(谭植元), Sun Tian-Xi(孙天希),and Liu Zhi-Guo(刘志国)
  Measurement of inner surface roughness of capillary by an x-ray reflectivity method
    Chin. Phys. B   2011 Vol.20 (4): 40702-040702 [Abstract] (1348) [HTML 0 KB] [PDF 1582 KB] (993)
4554 Liu Chao-Feng (刘超峰), Ni Yu-Shan (倪玉山)
  The effect of surface roughness on rarefied gas flows by lattice Boltzmann method
    Chin. Phys. B   2008 Vol.17 (12): 4554-4561 [Abstract] (1370) [HTML 0 KB] [PDF 803 KB] (1026)
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